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Si552
Table 7. CLK± Output Phase Noise (Typical)
Offset Frequency
100 Hz
1 kHz
10 kHz
100 kHz
1 MHz
10 MHz
100 MHz
74.25 MHz
90 ppm/V
LVPECL
–87
–114
–132
–142
–148
–150
n/a
491.52 MHz
45 ppm/V
LVPECL
–75
–100
–116
–124
–135
–146
–147
622.08 MHz
135 ppm/V
LVPECL
–65
–90
–109
–121
–134
–146
–147
Units
dBc/Hz
Table 8. Environmental Compliance
The Si552 meets the following qualification test requirements.
Parameter
Mechanical Shock
Mechanical Vibration
Solderability
Gross & Fine Leak
Resistance to Solvents
Moisture Sensitivity Level
Contact Pads
Table 9. Thermal Characteristics
(Typical values TA = 25 oC, V DD = 3.3 V)
Conditions/Test Method
MIL-STD-883F, Method 2002.3 B
MIL-STD-883F, Method 2007.3 A
MIL-STD-883F, Method 203.8
MIL-STD-883F, Method 1014.7
MIL-STD-883F, Method 2016
J-STD-020, MSL 1
J-STD-020, MSL 1
Parameter
Thermal Resistance Junction to Ambient
Thermal Resistance Junction to Case
Ambient Temperature
Junction Temperature
Symbol
? JA
? JC
T A
T J
Test Condition
Still Air
Still Air
Min
—
—
–40
—
Typ
84.6
38.8
—
—
Max
—
—
85
125
Unit
°C/W
°C/W
°C
°C
Rev. 1.1
7
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